Conducted / Near-Field Emission Test, ChipScan-ESA Analysis Software

Conducted / Near-Field Emission Test P600 / P700 Probe series • Conducted emissions - 1 Ω / 150 Ω method • RF voltage and current measurement according IEC 61967-4 • Frequency range up to 3 GHz • Optional with integrated preamplifier • 0.1 Ω shunt resistor option available S603 / S750 Probe set • Conducted emissions - 1 Ω / 150 Ω method • RF voltage and current measurement according IEC 61967-4 • Frequency range up to 3 GHz • SMA connector P1600 / P1700 Probe set • Alternative test method to IEC...