EM Fault Injection, Surface Scan, ICR Probe series Near-Field Microprobes for Radiated Emission

LANGER한국대리점, 랑거한국대리점, 란거한국대리점 / 문의 010-3802-7361 EM Fault Injection ICI Probe series IC EM Pulse Injection Langer Pulse • Pulse injection into open Die → for pulse immunity analysis → side channel analysis • Pulse rise time: 2 ns • Spatial resolution: 500 µm The ICI probe series consist of three different ICI sources emitting electric, magnetic field and current pulses. This allows high precision and very high resolution IC analysis and body bias injection.

These sources allow side channel analy...