Conducted / Near-Field Emission Test, 반도체 칩 EMI측정 시스템, Surface Scan above ICs or PCBs

Conducted / Near-Field Emission Test 반도체 칩 EMI측정 시스템 Surface Scan above ICs or PCBs www.youtube.com/watch?v=rjncvlJxHLo P600 / P700 Probe series • Conducted emissions - 1 Ω / 150 Ω method • RF voltage and current measurement according IEC 61967-4 • Frequency range up to 3 GHz • Optional with integrated preamplifier • 0.1 Ω shunt resistor option available S603 / S750 Probe set • Conducted emissions - 1 Ω / 150 Ω method • RF voltage and current measurement according IEC 61967-4 • Frequency range u...